Handbook of Manufacturing
By Yong Huang, Lihui Wang & Steven Y. Liang
- Release Date: 2019-10-08
- Genre: Engineering
Handbook of Manufacturing provides a comprehensive overview of fundamental knowledge on manufacturing, covering various processes, manufacturing-related metrology and quality assessment and control, and manufacturing systems. Many modern processes such as additive manufacturing, micro- and nano-manufacturing, and biomedical manufacturing are also covered in this handbook. The handbook will help prepare readers for future exploration of manufacturing research as well as practical engineering applications.
Contents:Overview of Manufacturing (Yong Huang, Lihui Wang, and Steven Y Liang)Subtractive Processes — Traditional Operations: Cutting, Grinding, and Machine Tools (Steven Y Liang)Subtractive Processes — Non-Traditional Operations (Hitomi Yamaguchi, Robert Williams, Jun Wang, Albert Shih, Harmen Altena, Shuting Lei, Tsunemoto Kuriyagawa, and Noritsugu Umehara)Solidification Science and Engineering (Adrian V Catalina and Doru M Stefanescu)Deformation Processes (Brad L Kinsey, Ken-ichiro Mori, and Gracious Ngaile)Polymer and Composite Processing (Donggang Yao, Xudong Fang, and Yifeng Hong)Additive Processes (Renwei Liu, Zhiyuan Wang, and Frank Liou)Micro- and Nano-Manufacturing (F F Xu and F Z Fang)Biomedical Manufacturing (Albert J Shih, Wei Li, and Yong Huang)Measurement Technologies for Manufacturing (Yuki Shimizu, So Ito, Jungchul Lee, Shigeaki Goto, Hiraku Matsukuma, and Wei Gao)Manufacturing Quality Assessment and Control (Laine Mears, John Ziegert, John T Roth, and Beshoy Morkos)Manufacturing Systems (Xun Xu, Lihui Wang, Jenny Xu, Xi Wang, and Frederick M Proctor)
Readership: This book is intended for students and professionals interested in manufacturing research as well as practical engineering applications. Manufacturing Process;Manufacturing Metrology;Manufacturing Quality Assessment and Control;Manufacturing System0Key Features:ComprehensiveUp-to-dateContributed by established scholars in their respective fields