Advanced VLSI Design and Testability Issues - Suman Lata Tripathi, Sobhit Saxena & Sushanta Kumar Mohapatra

Advanced VLSI Design and Testability Issues

By Suman Lata Tripathi, Sobhit Saxena & Sushanta Kumar Mohapatra

  • Release Date: 2020-08-18
  • Genre: Electrical Engineering

This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, including image processing and biomedical. The deep understanding of basic concepts gives you the power to develop a new application aspect, which is very well taken care of in this book by using simple language in explaining the concepts. In the VLSI world, the importance of hardware description languages cannot be ignored, as the designing of such dense and complex circuits is not possible without them. Both Verilog and VHDL languages are used here for designing. The current needs of high-performance integrated circuits (ICs) including low power devices and new emerging materials, which can play a very important role in achieving new functionalities, are the most interesting part of the book. The testing of VLSI circuits becomes more crucial than the designing of the circuits in this nanometer technology era. The role of fault simulation algorithms is very well explained, and its implementation using Verilog is the key aspect of this book.

This book is well organized into 20 chapters. Chapter 1 emphasizes on uses of FPGA on various image processing and biomedical applications. Then, the descriptions enlighten the basic understanding of digital design from the perspective of HDL in Chapters 2–5. The performance enhancement with alternate material or geometry for silicon-based FET designs is focused in Chapters 6 and 7. Chapters 8 and 9 describe the study of bimolecular interactions with biosensing FETs. Chapters 10–13 deal with advanced FET structures available in various shapes, materials such as nanowire, HFET, and their comparison in terms of device performance metrics calculation. Chapters 14–18 describe different application-specific VLSI design techniques and challenges for analog and digital circuit designs. Chapter 19 explains the VLSI testability issues with the description of simulation and its categorization into logic and fault simulation for test pattern generation using Verilog HDL. Chapter 20 deals with a secured VLSI design with hardware obfuscation by hiding the IC’s structure and function, which makes it much more difficult to reverse engineer.

Comments:

12 Comments
Taylor Mackenzie
Amazing! I love this site
Aston Ayers
Only Signup is easy and free, finally I can read this book Advanced VLSI Design and Testability Issues with good quality. Thank you!
Ashley Ann
Been waiting to download this book for months. and finally came out too
Cheryl Lynn
This book Advanced VLSI Design and Testability Issues is very nice, with quick read and download
Erin Cochran Cole
Great selection and quality is better than many Book Store, no kidding.
Kyle Magner
yes, i am also through this to download books
Eric Mn
Yes this really works! Just got my free account
Terry Barnes
One of the best book I've seen this year!
Pastor Shahuano
Excited, Happy Reading guys !!!
Laura Velez Garcia
Thanks, I'm so glad to be reading this book
Wouter van der Giessen
Laura Velez Garcia yes same me too
Janet McCann
Sign up was really easy. Less than 1 minute I was hooked up